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dc.contributor.author
Vögeli, Bernhard
dc.contributor.supervisor
Bauer, Günter
dc.contributor.supervisor
Wachter, Peter
dc.date.accessioned
2017-06-13T02:26:33Z
dc.date.available
2017-06-13T02:26:33Z
dc.date.issued
1998
dc.identifier.uri
http://hdl.handle.net/20.500.11850/143810
dc.identifier.doi
10.3929/ethz-a-001989893
dc.language.iso
en
dc.publisher
ETH Zürich
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
SILICIUM (CHEMISCHE ELEMENTE)
dc.subject
GERMANIUM (CHEMISCHE ELEMENTE)
dc.subject
HETEROKONTAKT + HETEROSTRUKTUR (KRISTALLOGRAPHIE)
dc.subject
EPITAXIALSCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN)
dc.subject
IONENSPUTTERING (ELEKTRODYNAMIK)
dc.subject
NULLDIMENSIONALE STRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE)
dc.subject
RASTERTUNNELMIKROSKOPE, RTM + RASTERTUNNELMIKROSKOPIE
dc.subject
SILICON (CHEMICAL ELEMENTS)
dc.subject
GERMANIUM (CHEMICAL ELEMENTS)
dc.subject
HETEROJUNCTION + HETEROSTRUCTURE (CRYSTALLOGRAPHY)
dc.subject
THIN LAYER FORMATION BY VAPORIZATION AND CONDENSATION (PHYSICS OF MOLECULAR SYSTEMS)
dc.subject
ION SPUTTERING (ELECTRODYNAMICS)
dc.subject
ZERO-DIMENSIONAL STRUCTURE (CONDENSED MATTER PHYSICS)
dc.subject
SCANNING TUNNELING MICROSCOPES, STM + SCANNING TUNNELING MICROSCOPY
dc.title
STM study of Si-Ge heterostructures grown by magnetron sputter epitaxy
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
109 S.
ethz.code.ddc
5 - Science::530 - Physics
ethz.notes
Diss. Naturwiss. ETH Zürich, Nr. 12882, 1998. Ref.: P. Wachter ; Korref.: G. Bauer ; Korref.: H. von Känel.
ethz.identifier.diss
12882
ethz.identifier.nebis
001989893
ethz.publication.place
Zürich
ethz.publication.status
published
ethz.leitzahl
03118 - Wachter, Peter
ethz.date.deposited
2017-06-13T02:28:10Z
ethz.source
ECOL
ethz.identifier.importid
imp59366a1dcf45828159
ethz.ecolpid
eth:22697
ethz.eth
yes
ethz.availability
Open access
ethz.rosetta.installDate
2017-07-31T12:43:28Z
ethz.rosetta.lastUpdated
2018-11-04T00:41:24Z
ethz.rosetta.versionExported
true
ethz.COinS
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