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dc.contributor.author
Wermelinger, Thomas
dc.contributor.author
Spolenak, Ralph
dc.date.accessioned
2017-06-08T21:59:41Z
dc.date.available
2017-06-08T21:59:41Z
dc.date.issued
2009
dc.identifier.issn
0021-8979
dc.identifier.issn
1089-7550
dc.identifier.other
10.1063/1.3224891
dc.identifier.uri
http://hdl.handle.net/20.500.11850/16063
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.subject
cathodoluminescence
dc.subject
crystal microstructure
dc.subject
crystal symmetry
dc.subject
dislocation density
dc.subject
II-VI semiconductors
dc.subject
internal stresses
dc.subject
plastic deformation
dc.subject
Raman spectra
dc.subject
transmission electron microscopy
dc.subject
Vickers hardness
dc.subject
wide band gap semiconductors
dc.subject
zinc compounds
dc.title
Symmetry of residual stress fields of ZnO below an indent measured by three-dimensional Raman spectroscopy
dc.type
Journal Article
ethz.journal.title
Journal of Applied Physics
ethz.journal.volume
106
ethz.journal.issue
6
ethz.journal.abbreviated
J. appl. physi.
ethz.pages.start
064907
ethz.size
7 p.
ethz.notes
Received 8 May 2009, Accepted 12 August 2009, Published online 21 September 2009.
ethz.identifier.wos
ethz.identifier.nebis
000037502
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.date.deposited
2017-06-08T21:59:57Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c5e32a6b74370
ethz.ecitpid
pub:27908
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T23:52:21Z
ethz.rosetta.lastUpdated
2018-04-01T04:18:00Z
ethz.rosetta.versionExported
true
ethz.COinS
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