Ferroelectric-Like Charge Trapping Thin-Film Transistors and Their Evaluation as Memories and Synaptic Devices
dc.contributor.author
Daus, Alwin
dc.contributor.author
Lenarczyk, Pawel
dc.contributor.author
Petti, Luisa
dc.contributor.author
Münzenrieder, Niko
dc.contributor.author
Knobelspies, Stefan
dc.contributor.author
Cantarella, Giuseppe
dc.contributor.author
Vogt, Christian
dc.contributor.author
Salvatore, Giovanni A.
dc.contributor.author
Luisier, Mathieu
dc.contributor.author
Tröster, Gerhard
dc.date.accessioned
2018-01-30T12:38:59Z
dc.date.available
2017-10-24T12:35:18Z
dc.date.available
2017-11-06T16:14:06Z
dc.date.available
2017-11-06T16:15:08Z
dc.date.available
2018-01-09T15:04:59Z
dc.date.available
2018-01-30T12:38:59Z
dc.date.issued
2017-12
dc.identifier.issn
2199-160X
dc.identifier.other
10.1002/aelm.201700309
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/238080
dc.language.iso
en
en_US
dc.publisher
Wiley
en_US
dc.subject
Charge trapping
en_US
dc.subject
Defects
en_US
dc.subject
High-k dielectrics
en_US
dc.subject
Memories
en_US
dc.subject
Synapses
en_US
dc.title
Ferroelectric-Like Charge Trapping Thin-Film Transistors and Their Evaluation as Memories and Synaptic Devices
en_US
dc.type
Journal Article
dc.date.published
2017-10-12
ethz.journal.title
Advanced Electronic Materials
ethz.journal.volume
3
en_US
ethz.journal.issue
12
en_US
ethz.pages.start
1700309
en_US
ethz.size
9 p.
en_US
ethz.code.ddc
DDC - DDC::5 - Science
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Chichester
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03388 - Tröster, Gerhard (emeritus)
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03388 - Tröster, Gerhard (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-10-24T12:35:19Z
ethz.source
FORM
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-02-01T13:40:31Z
ethz.rosetta.lastUpdated
2022-03-28T19:05:21Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/199809
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/237058
ethz.COinS
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Journal Article [130606]