Search
Results
-
Detecting the topographic, chemical and magnetic contrast at surfaces with nanometer spatial resolution
(2014)2014 Tenth International Vacuum Electron Sources Conference and Second International Conference on Emission Electronics. IVESC-ICEE-ICCTPEA-BDO-2014. June 30 - July 4, 2014. Russia, Saint-Petersburg. ProceedingsConference Paper -
Domain configuration in perpendicularly magnetized atomically thin iron particles
(2004)Journal of Magnetism and Magnetic MaterialsConference Paper -
Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
(2021)In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (ϕ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of ϕ in greater detail, a sample of ...Conference Paper -
Improving the topografiner technology down to nanometer spatial resolution
(2014)Technical Digest of the 27th International Vacuum Nanoelectronics ConferenceConference Paper -
Lateral Resolution of the NFESE microscopy and existence of self focusing of electrons
(2011)Vacumm Nanoelectronics Conference (IVNC), 24th InternationalConference Paper -
Magnetic Analysis of Ultrathin Fe Films on W(011) with SFEMPA
(2020)2020 33rd International Vacuum Nanoelectronics Conference (IVNC)An ultra-high vacuum Scanning Tunneling Microscope (STM) is converted into a lens-less low-energy Scanning Electron Microscope when the tip-target distance is some tens of nanometers and the tip acts as a source of field emitted electrons. This primary electron beam excites locally secondary electrons out of the sample. Those escaping the tip-target junction are analyzed according to their spin. We use this technology to measure the local ...Conference Paper -
Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography
(2016)European Microscopy Congress 2016: ProceedingsConference Paper -
Simulation of low energy electrons in Scanning Field Emission Microscopy (SFEM)
(2020)Papers und Präsentationen der COMSOL Conference 2020Conference Paper -
Progress in electron beam generation for Near Field-Emission Scanning Electron Microscopy
(2012)Bulletin SPG/SSPConference Paper -
Near Field-Emission SEM
(2012)25th International Vacuum Nanoelectronics Conference (IVNC) 2012 : 9-13 July 2012, Jeju, South KoreaConference Paper