An Optimal Policy for Target Localization with Application to Electron Microscopy
dc.contributor.author
Sznitman, Raphael
dc.contributor.author
Lucchi, Aurélien
dc.contributor.author
Frazier, Peter I.
dc.contributor.author
Jedynak, Bruno M.
dc.contributor.author
Fua, Pascal
dc.contributor.editor
Dasgupta, Sanjoy
dc.contributor.editor
McAllester, David
dc.date.accessioned
2017-06-11T13:59:42Z
dc.date.available
2017-06-11T13:59:42Z
dc.date.issued
2013
dc.identifier.issn
1938-7228
dc.identifier.uri
http://hdl.handle.net/20.500.11850/92962
dc.language.iso
en
dc.publisher
Curran
dc.title
An Optimal Policy for Target Localization with Application to Electron Microscopy
dc.type
Conference Paper
ethz.book.title
Proceedings of the 30th International Conference on Machine Learning
ethz.journal.title
JMLR Workshop and Conference Proceedings
ethz.journal.volume
28
ethz.journal.issue
1
ethz.pages.start
1
ethz.pages.end
9
ethz.event
International Conference on Machine Learning (ICML 2013)
ethz.event.location
Atlanta, GA, USA
ethz.event.date
June 16-21, 2013
ethz.publication.place
Red Hook, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02661 - Institut für Maschinelles Lernen / Institute for Machine Learning::09462 - Hofmann, Thomas / Hofmann, Thomas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02661 - Institut für Maschinelles Lernen / Institute for Machine Learning::09462 - Hofmann, Thomas / Hofmann, Thomas
ethz.date.deposited
2017-06-11T13:59:50Z
ethz.source
ECIT
ethz.identifier.importid
imp593652905d8fb58439
ethz.ecitpid
pub:146128
ethz.eth
no
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T17:49:56Z
ethz.rosetta.lastUpdated
2024-02-01T22:25:51Z
ethz.rosetta.versionExported
true
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Conference Paper [34983]